SEM with EDX

Capabilities: General microscopy/Variable pressure microscopy/Quantitative analysis (morphology and composition).

Model: Hitachi S-3000N VP

Uses: Contamination identification, discolouraSEM with EDX.pngtion, determining elemental composition, particle shape, size and distribution analysis, surface composition/contamination, topography and weathering effects.

Problems addressed: Microscopy: Surface characterisations. Observation of micron to submicron particles. Elemental composition.

Advantages: Resolution of 10 nm at 3 kV. Real time full screen image, dual image and signal mixing.