X-ray micro computed tomography

Capabilities: Non-destructive 3D analysis of components

Model: VTOMEX L300 & Nanotom S

Problems addressed: Defect analysis. Nominal comparison to CAD. Wall thickness analysis. CMM type measurements. Analysisof unusual features. Powder analysis.

Advantages: Significantly faster than micro-sectioning. Non-destructive.

VTOMEX L 300.jpgnanotom..pngVitomix.jpgnanotom.png

XMT Examples